FCMN-Frontiers of Characterization and Metrology for Nanoelectronics

As part of the FCMN2026 International Conference, which took place from 16 to 19 March 2026 in Monterey (California), Maxime Besacier, director of the LTM, was invited to give an oral presentation on 18 March. He presented his work entitled: "Hybrid metrology assisted by machine learning at the nanoscale." An innovative approach that illustrates the key role of combining advanced measurement techniques and artificial intelligence to push the boundaries of characterization of nanoelectronic devices.